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12. Technology Based Indicators
P- 07. Informetrics & Scientometrics *
By :I K Ravichandra Rao,Paper Coordinator
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12. Technology based indicatorsP- 07. Informetrics & Scientometrics * |
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Summary: Patents can analyze rate and direction of technical change; An important part in the overall innovation process; Can be visualized as output of industrial R&D; Generated during the whole technology life cycle, they cover basic as well as incremental innovations; The patent data cover virtually every field of technology although exhibiting strong skewness to some fields; Detailed classification in patent documents allows unlimited choice of aggregation: From basic fields to technology down to single products.
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Strenghths: Long historical time series available; publicly available (no secrecy problems); Relatively consistent over time; Classification by technical field is possible; Citation analysis is possible
Some of the Patent based Indicators:
- Number of Patents Granted by a patent office (say the US Patent Office) to a country/firm/research organisation to identify intensity of technological activity (patent acting as ‘proxy’ for technological activity).
- Number of patents in a technology class/ in a sector by a country/firm/research organisation identify technological competency. Further normalized to show more accurately the technology competency (see below Relative Technological Advantage)
- Relative share of country patents w.r.t to world output year-wise (or for a chosen period) to identify country’s technological activity globally.
- Cites Per Patent: A count of citations received by a company’s patents (for example year-wise or other-wise). The assumption is that Patents that receive more citations are Technological important patents
- Number of claims: The number of claims provides an indication of the legal breadth of patent protection. It is a sign of the complexity of a patent. One could argue that the breadth and complexity it implies should coincide with value.
- Number of inventors: This indicator is based on the hypothesis that a patent resulting from the research of several inventors should be more valuable than a patent which was developed by a single inventor.
- Number of IPC classes: This indicator concerns the scope or breadth of a patent in terms of technology classes.
Technological specialization profile of the countries according to International Patent Classification (IPC) as percentage distribution of patents.
- Current Impact Index: Measure based on how often a company’s patents are cited by other patents. The number of times a company’s most recent five years of patents are cited in the current year, relative to the entire patent database. It is a synchronous indicator, looking backwards from the current year to the previous five years; thus sensitive to a company’s current technology.
- Technology Strength: The number of patents times the current impact index (will indicate the technology strength of a company’s newly issued patents).
- Relative Technological Advantage (RTA): Number of indicators like patent shares, growth rate are used to compare national technological performance but the problem with them is that they do not take into account the different propensity to patent in US among different countries. RTA corrects this bias.
With: Pij = number of patents of firm j in sector i; Pj= number of patents of firm j in all areas; Pi= number of patents of the country in sector I; P=total patents of the country
RTAij greater than one indicates higher activity/specialisation and vice-versa (with respect to the country’s strength).
- Technology Cycle Time: The median age of the patent references cited in the company’s new patents.
- Science linkage: The average number of science papers referenced in the patents provides an indication of linkage between technology and science. Due to detailed availability in the US patent documents this input indicator is generally used for US patent office.
Scientific Intensity (of a country/firm) = Number of Patents (of a country or firm) × Science linkage
Iot can also be used to judge which field is more science intensive than the other
Front page of US Patent
One of the useful ways to identify patents within a technology field/research areas is through a Three Phase Model (Narin et al. 1993)
i) Technology Plane itself, where the activity under scrutiny is occurring; ii) A precursor or base plane where earlier, cited research has occurred; iii) a successor citing patents, encompassing new applications or variations of the central technology.
(The lines among the successor, technology, and base planes are very thin; it is one of classification and judgment).
The three planes represent closely related areas. They may also represent particularly in the successor plane, leading indicators of future activity.
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Advantages and disadvantages of patents as a science and technology metric
Strengths and benefits
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Weaknesses and problems
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Source: Geisler (2000), author’s own construction
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Testing Students Ability
Why patent is a useful indicator of technology activity?
Why citations are important in a patent?
How will you judge importance of a country’s technology strength through patent?
True/False
Patent can identify that a particular technology has strong scientific linkage?
Citations given by applicants are used to judge novelty of a patent?
Technology class of a patent is identified through International Patent Classification?
References
- Fred Gault. (2007). Science, Technology and Innovation Indicators: The context of change. In Science, Technology and Innovation Indicators in a changing World – Responding to Policy needs, OECD. Pp. 9-23
- Narin, F (2000). Tech-Line Background Paper. Available at:http://www.chiresearch.com/techline/tlbp.pdf
- Narin, F., Smith jr., V. and Albert, M.: 1993, What patents tell you about your competition, ChemTech February, 52–59
· Geisler, E. 2000. The Metrics of Science and Technology, Westport, CT: Greenwood Press.
· Moed, H F, Glanzel, W. and Schmoch, U. (2004). Handbook of Quantitative Studies of Science and Technology Research. Kluwer Academic Publishers: The Netherlands.
· OECD Patent Statistics Manual (2009). Paris: OECD Publishing. (http://www.oecd.org/)
· Van Raan A. F. J. (1988). Handbook of Quantitative Studies of Science and Technology. Elsevier Science publishers R.V: The Netherlands.
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